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Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

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China Pego Group (HK) Company Limited certification
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Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1
Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1 Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

Large Image :  Metal Material Test Probe Kits Wedge Probe Jointed / Rigid Test Finger IEC60950-1

Product Details:
Place of Origin: China
Brand Name: PEGO GROUP
Certification: Third-Lab Calibration Certificate
Model Number: PG-TP
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: USD300~USD10000
Packaging Details: carton
Delivery Time: 7 working days
Payment Terms: T/T, Western Union, MoneyGram
Detailed Product Description
Standard: IEC60950-1, IEC61032 Material: Metal And Insulating Material
Configuration: Wedge Probe, Jointed Test Finger, Rigid Test Finger, Test Pin Shipment: By Express
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IEC60950-1 Test Probe Kits (Wedge Probe, Jointed Test Finger, Rigid Test Finger and Test Pin)

 

1. Introduction

The test probe kits are meet the requirement of IEC60950-1, includes jointed test finger, test pin, unjointed test finger, TNV test probe and wedge probe, they are applied to test the person’s protection from live parts and hazardous parts of information technology equipment.

 

2. Specification

Name Figure number Parameter
Jointed test finger (test probe B)

IEC60950-1 figure 2A

IEC61032 figure 2

Purpose:Protection of person’s finger from live parts

Specification:

1). Diameter of dactylogryposis: Φ12mm

2). Length of dactylogryposis: 80mm

3). Diameter of baffle. Φ50mm

4). Length of baffle: 100mm

Test pin (test probe 13)

IEC60950-1 figure 2B

IEC61032 figure 9

Purpose: Protection against access to hazardous live parts in class 0 equipment and class II equipment

Specification:

1). Diameter: Φ3mm (head), Φ4mm (tails)

2). Length of probe: 15mm

3). Diameter of baffle: Φ25mm

4). Thickness of baffle: 4mm

Test probe IEC60950-1 figure 2C

Purpose: Protection against access to bare parts of TNV circuits.

Specification:

1). Diameter of the probe: Φ12mm

2). Length of the probe: 80mm

3). Diameter of baffle: Φ50mm

4). Thickness of baffle: 5mm

Straight unjointed test finger with 30N force (test probe 11)

IEC60950-1 clause 2.1.1.1

IEC61-32 figure 7

Purpose: protection of persons against access to hazardous parts

Specification: the size is as same as test probe B, but without joints, 30N force is applied.

Wedge probe IEC60950-1 figure EE.1 and EE.2

Purpose:protection from contact hazardous moving parts, including the shredding rollers/mechanisms.

Specification:

1). Diameter of the probe: Φ50mm

2). Length of the probe: 300mm

3). Length of first tip: 30mm

4). Length of second tip: 60mm

5). Length of third tip: 100mm

 

3. COMPETITIVE ADVANTAGE
1). PEGO is professional on electrical lab testing equipment, our goal is to provide our customers with better price, better quality and better service.
2). Customized Service: We can help our customers to design and develop new equipment according to their requirement. We are flexible and capable Supplier.
3).Excellent Quality: 12 months warranty, 100% guarantee test before delivery. And all our products can pass the third-lab calibration which is authorized by ISO17025.
4). After Sales Service and Technical Assistance: 24 hours technical support by email. Our professional team is always here willing to be your technical consultant.
5). Quick Delivery: Our company provides just-in-time delivery, and our freight forwarder can provide transportation services at the most reasonable price to solve your worries.
6). Prompt Response to Customers: we promise to reply our customers within 24 hours

Contact Details
Pego Group (HK) Company Limited

Contact Person: sales

Tel: +8618979554054

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