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Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X

China Pego Electronics (Yi Chun) Company Limited certification
China Pego Electronics (Yi Chun) Company Limited certification
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—— ESTI Formation

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Dear Penny, We really appreciate to buying from Pego Group for several years, all products come with good quality amd easy operation.

—— LIA Laboratories Limited

I have received the spring hammers, they are great!

—— BSH Group

Yes we got the probes and our engineers like them. Thanks.

—— Gamma Illumination Pty Ltd

the spring hammer looks good and works fine

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—— Brandt France

we can confirm that it works very well! thank you for the good quality equipment.

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Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X

Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X
Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X

Large Image :  Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X

Product Details:
Place of Origin: China
Brand Name: PEGO
Certification: Third-Lab Calibration Certificate
Model Number: IPXX
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: USD200~USD300
Packaging Details: carton
Delivery Time: 7 working days
Payment Terms: T/T, Western Union, MoneyGram
Detailed Product Description
Standard: IEC60529, IEC61032 IP Code: IP1X, IP2X, IP3X, And IP4X
Name: Test Probe A, Test Probe B, Test Probe C, Test Probe D, Test Probe 1, Test Probe 2 Application: Protection Against To Live Part And Accessiblity Parts
Material: Nylon (handle), Steel (test Wire, Test Rod, Test Sphere, Tet Finger) Warranty: 1 Year
High Light:

ingress protection test equipment

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waterproof test equipment

IEC60529 IP1X IP2X IP3X IP4X Test Finger Probe with Third-lab Calibration Certificate
 
1. Introduction
The IP code test probes are designed accoring to IEC60529 and IEC61032 standard. It includes test probe A (Sphere:Φ50 with handle) for IP1X test, test probe 1 (Sphere: Φ50)  for IP10 test, test probe B (Jointed test finger) for IP2X test, test probe C (Rod: Φ2.5-length 100) for IP3X test, test probe D (Wire: Φ1.0-length 100) for IP4X and test probe 2 (Sphere: Φ12.5) for IP20 test. All the probes can provide with a third-lab calibration certificate  which authorized by ISO17025 Lab.
 
2. Specification

1). Test probe A (Sphere:Φ50 with handle) for IP1X test
Test probe A ( Φ50 sphere with handle) is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts. Test probe A with 50N force is means for the protection of person’s back of hand from hazard parts.

Diameter of test sphere:50mmDiameter of baffle:45mm
Thickness of baffle:4mmDiameter of handle:10mm
Length of handle:100mmThruster (optional) :50N
Material: insulating material (handle and baffle), metal (test sphere)

 

 

2).  test probe 1 (Sphere: Φ50) for IP10 test
Test probe 1 (500g test sphere) is designed according to IEC61032 figure 5, meet the requirement of IEC60529-IP. The diameter of the sphere is 50mm+0.05. Test probe 1 is for IP1X testing, it means for the protection against solid foreign objects of Φ50mm or greater.

Diameter of sphere50mm+0.05
Weight of the sphere500g
Materialsteel


3). test probe B (Jointed test finger) for IP2X test
Introduction:

Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. Test probe B with 10N force is for IP2X testing, it means for the protection of person’s finger from hazard parts.

ModelPG-TPB
Jointed point size 130±0.2
Jointed point size 260±0.2
Length of finger80±0.2
Fingertip to baffle size180±0.2
Fingertip taper filletS4±0.05
Diameter of fingerФ12 0 -0.05
Diameter of baffleФ75±0.2
Thickness of baffle5±0.5
A-A section diameterФ50
A-A section widthФ20±0.2
Thruster10N optional
StandardIEC61032

 
4. test probe C (Rod: Φ2.5-length 100) for IP3X test
Test probe C (test rod) Designed according to IEC61032 figure 3, meet the requirements of IEC60529-IP3, IEC60065,IEC60598 and etc.
Test probe C is for IP3X testing, it means for the protection against solid foreign objects of Φ2.5mm and greater. Test probe C with 3N force is for IP3X testing, it means for the protection of person’s tool from hazard parts.

Length of test rod:100mmDiameter of test rod:2.5mm
Diameter of stop sphere:35mmDiameter of handle:10mm
Length of handle:100mmThruster (optional):3N
Material: Insulating material (handle, sphere), metal (test rod)

 
5.test probe D (Wire: Φ1.0-length 100) for IP4X
Test probe D (Test wire) Designed according to IEC61032 figure 4, meet the requirements of IEC60529-IP3,IEC60065,IEC60598 and etc.
Test probe D is for IP4X testing, it means for the protection against solid foreign objects of Φ1.0mm and greater. Test probe D with 1N force is for IP4X testing, it means for the protection of person’s wire from hazard parts.

Length of test wire:100mmDiameter of test wire:1mm
Diameter of stop sphere:35mmDiameter of handle:10mm
Length of handle:100mmThruster (optional)1N
Material: Insulation material (handle, stop sphere), metal (test wire)

 
6. test probe 2 (Sphere: Φ12.5) for IP20 test
Test probe 2 (15g test sphere) Designed according to IEC61032 figure 6, meet the requirement of IEC60529-IP2. The diameter of sphere is 12.5+0.2. Test probe 2 is for IP2X testing, it means for the protection against solid foreign objects of Φ12.5mm or greater. 

Diameter of sphere12.5mm+0.05
Weight of the sphere15g
Materialsteel

 Finger Probe IP Testing Equipment New Condition IEC60529 IP1X IP2X IP3X IP4X 0

Contact Details
Pego Electronics (Yi Chun) Company Limited

Contact Person: Ms. Penny Peng

Tel: +86-18979554054

Fax: 86--4008266163-29929

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