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10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

China Pego Electronics (Yi Chun) Company Limited certification
China Pego Electronics (Yi Chun) Company Limited certification
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—— ESTI Formation

Dear Alice, The machines are working well now. Thank you for your support and patience to solve our problems and give us very useful suggestions in negotiation. Really a good cooperation.

—— TUV Rheinland Pvt. Ltd

Dear Penny, We really appreciate to buying from Pego Group for several years, all products come with good quality amd easy operation.

—— LIA Laboratories Limited

I have received the spring hammers, they are great!

—— BSH Group

Yes we got the probes and our engineers like them. Thanks.

—— Gamma Illumination Pty Ltd

the spring hammer looks good and works fine

—— Sigma Connectivity

This is to confirm the order has been well received and all is in good order. May I thank you for your very professional service.This has been a pleasant transaction.

—— Gallagher Group

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—— 유진코퍼레이션에 황동익입니다.

I am sending this email to let you know that we receive the 2 vessels with the calibration certificate. I would like to thank you for the quality of the vessels and for your good work. I can’t wait to work with you on other topics.

—— Brandt France

we can confirm that it works very well! thank you for the good quality equipment.

—— PPC (Greece)

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10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation
10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation
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Large Image :  10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

Product Details:
Place of Origin: China
Brand Name: PEGO
Certification: Third-lab Calibration Certificate
Model Number: PG-TPB
Payment & Shipping Terms:
Minimum Order Quantity: 1set
Price: USD450-600/set
Packaging Details: carton box
Delivery Time: 15 working days
Payment Terms: T/T, Western Union, MoneyGram
Detailed Product Description
Standard: IEC61032, IEC60529 Material: Metal And Insluating Material
Application: Accessible Probe Force Applied: 10N, 20N, 30N, 40N, 50N
Condition: New Shippment: By Express
HS Code: 9024900000 IP Code: IP2X
High Light:

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finger probe test

IEC61032 Test Finger Probe Test Probe B Jointed Test Finger 10N Force

 

1. Introduction of Test Probe B:

The test probe is is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The jointed test finger is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.

 

2. Specification Jointed Test Finger:

Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
Diameter of baffle: 50mm Length of baffle: 100mm  
Material: Insulating material (baffle and handle), metal(dactylogryposis)

 

3. Key Advantage of Jointed Finger Probe

1) Can pass the calibration from third lab authorized by ISO17025

2) It's fully meets the requirements of IEC61032 and IEC60529 standard

3) Easy operation

 

4. Picture of IEC61032 Test Finger Probe:

10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation 0

Contact Details
Pego Electronics (Yi Chun) Company Limited

Contact Person: Ms. Penny Peng

Tel: +86-18979554054

Fax: 86--4008266163-29929

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