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Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

China Pego Electronics (Yi Chun) Company Limited certification
China Pego Electronics (Yi Chun) Company Limited certification
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Dear Penny, We really appreciate to buying from Pego Group for several years, all products come with good quality amd easy operation.

—— LIA Laboratories Limited

I have received the spring hammers, they are great!

—— BSH Group

Yes we got the probes and our engineers like them. Thanks.

—— Gamma Illumination Pty Ltd

the spring hammer looks good and works fine

—— Sigma Connectivity

This is to confirm the order has been well received and all is in good order. May I thank you for your very professional service.This has been a pleasant transaction.

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I am sending this email to let you know that we receive the 2 vessels with the calibration certificate. I would like to thank you for the quality of the vessels and for your good work. I can’t wait to work with you on other topics.

—— Brandt France

we can confirm that it works very well! thank you for the good quality equipment.

—— PPC (Greece)

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Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing
Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

Large Image :  Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

Product Details:
Place of Origin: China
Brand Name: Pego Electronics
Certification: Third-Lab Calibration Certificate
Model Number: PG-TPB
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: Negotiation
Packaging Details: protection case+carton
Delivery Time: 3 working days
Payment Terms: T/T,PayPal
Supply Ability: 1000pc/month
Detailed Product Description
Standard Conform To: IEC61032, IEC60601, IEC62368-1, IEC60598-1, IEC60529 Material: Insluating Material (hanndle), And Metal (finger)
Lead Time: 3 Working Days Application: For Verifying The Accessility To Hazardous Parts
Type: Access Probe Thruster: 0N-50N
Highlight:

30±0.2 Jointed Point Test Finger Probe

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80±0.2 Length Standard Test Finger

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180±0.2 Fingertip to Baffle Jointed Test Finger

Insulating Material Standard Test Finger for Accessibility Test Thruster 0N-50N
Standard Test Finger for Accessibility Test
Introduction
The Standard Test Finger, also known as jointed test finger or test probe B, simulates human fingers to verify accessibility to hazardous parts in electrical and electronic devices. This essential testing tool is widely referenced in standards including IEC60335-1, IEC62368-1, and IEC60598-1.
Designed in strict compliance with IEC61032 Figure 2, the probe features an insulating handle and metal finger. The built-in 0-50N thruster accommodates required test forces of 10N and 30N. An integrated wire connects to an electrical indicator to detect accessibility of hazardous live parts.
Specification
Model PG-TPB
Jointed point size 1 30±0.2
Jointed point size 2 60±0.2
Length of finger 80±0.2
Fingertip to baffle size 180±0.2
Fingertip taper fillet S4±0.05
Diameter of finger Ф12 0 -0.05
Diameter of baffle Ф75±0.2
Thickness of baffle 5±0.5
A-A section diameter Ф50
A-A section width Ф20±0.2
Thruster 10N optional
Standard IEC61032
Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing 0

Contact Details
Pego Electronics (Yi Chun) Company Limited

Contact Person: Ms. Penny Peng

Tel: +86-18979554054

Fax: 86--4008266163-29929

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