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IEC61032 Standard Test Finger Probe with 0~50N Force for IP2X Testing and Long Lifespan

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IEC61032 Standard Test Finger Probe with 0~50N Force for IP2X Testing and Long Lifespan

IEC61032 Standard Test Finger Probe with 0~50N Force for IP2X Testing and Long Lifespan
IEC61032 Standard Test Finger Probe with 0~50N Force for IP2X Testing and Long Lifespan
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Large Image :  IEC61032 Standard Test Finger Probe with 0~50N Force for IP2X Testing and Long Lifespan

Product Details:
Place of Origin: China
Brand Name: PEGO
Certification: Third-Lab Calibration Certificate
Model Number: PG-TPB/PG-TP11
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: USD150~USD400
Packaging Details: carton
Delivery Time: 7 working days
Payment Terms: T/T,Western Union,MoneyGram
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Detailed Product Description
Reference: IEC60529, IEC61032, UL507, UL1278 Product Name: IEC Test Finger
Material: Steel And Plastic Lead Time: In Stock
Highlight:

0~50N Force Test Finger Probe

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IP2X Testing IEC Test Finger

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Long Lifespan Unjointed Test Finger

Unjointed Test Finger Probe 0~50N Force IEC61032 Standard With Long Lifespan

IEC61032 Standard Test Finger Probe and Unjointed Test Finger in Stock Can Be with Thruster

The standard test finger probe and unjointed test finger are designed according to IEC61032 standard. The standard test finger probe verifies basic protection against access to hazardous parts and protection against finger access. The Unjointed test finger probe verifies protection against hazardous part access and mechanical strength of enclosure openings. Both probes can be customized with thruster and pass calibration tests.

Standard Test Finger Probe

Designed according to IEC61032 figure 2, meeting requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The Standard Test Finger Probe with 50N force is for IP2X testing, protecting fingers from hazard parts.

Specification Value
Diameter of dactylogryposis: 12mm
Length of dactylogryposis: 80mm
Diameter of baffle: 50mm
Length of baffle: 100mm
Thruster (optional) 50N
Material: Insulating material (baffle and handle), metal (dactylogryposis)
Unjointed Test Finger Probe

Designed according to IEC61032 figure 7 and UL clauses.

Parameter Value
Diameter of test finger 12mm
Length of test finger 80mm
Diameter of baffle 50mm
Thickness of baffle: 5mm
Strength range 10N, 20N, 30N, 40N, 50N
Material Insulating material, metal
About Pego

Pego Tester (Jiangxi), founded by PEGO GROUP in 2011, is a professional high-tech enterprise specializing in developing, marketing, and servicing electronic test equipment. Our product range includes:

  • IEC60061-3 gauges for lamp caps and holders
  • UL498/VDE0620/BS1363-1 gauges for plug and socket
  • IEC61032 IP code probes and UL probes
  • Various test apparatus including flame, glow-wire, and needle flame testers
  • Electrical testers (ground resistance, insulating resistance, hipot)
  • Environmental test equipment (temperature chambers, waterproof test equipment)
  • Mechanical test equipment (spring hammer, pendulum hammer, tumbling barrel)

We maintain several production lines in China, utilizing advanced technology and machines to ensure high precision. Our products feature world-famous-brand components for reliability. We offer short lead times and can provide third-lab calibration certificates upon request.

Pego products are used worldwide in labs, production lines, QC, and R&D departments, known for their high precision, simple operation, human-centered design, and excellent performance.

Our motto: "To provide better user experience with better quality and better price." As test requirements grow, PEGO aims to grow with our users and develop better test solutions.

Tag:

finger probe test,

ul articulated finger probe,

ul test finger

Contact Details
Pego Electronics (Yi Chun) Company Limited

Contact Person: Ms. Penny Peng

Tel: +86-18979554054

Fax: 86--4008266163-29929

Send your inquiry directly to us (0 / 3000)

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